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    CTL for Test Information of Digital ICs

    Free Download CTL for Test Information of Digital ICs by Rohit Kapur English | PDF | 2002 | 183 Pages | ISBN : 1402072937 | 2.7 MB CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6 namely...
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    • ctl digital information test
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