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ellipsometry

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    Introduction to Spectroscopic Ellipsometry of Thin Film Materials Instrumentation, Data Analysis, and Applications

    Free Download Introduction to Spectroscopic Ellipsometry of Thin Film Materials by Wee, Andrew T. S.;Yin, Xinmao;Tang, Chi Sin; English | 2022 | ISBN: 3527349510 | 200 pages | True PDF EPUB | 28.23 MB A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for...
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