What's new

Welcome to App4Day.com

Join us now to get access to all our features. Once registered and logged in, you will be able to create topics, post replies to existing threads, give reputation to your fellow members, get your own private messenger, and so, so much more. It's also quick and totally free, so what are you waiting for?

Introduction to Spectroscopic Ellipsometry of Thin Film Materials Instrumentation, Data Analysis, and Applications

F

Frankie

Moderator
Joined
Jul 7, 2023
Messages
101,954
Reaction score
0
Points
36
08a93641067dde9066d44d798885c060.jpeg

Free Download Introduction to Spectroscopic Ellipsometry of Thin Film Materials
by Wee, Andrew T. S.;Yin, Xinmao;Tang, Chi Sin;

English | 2022 | ISBN: 3527349510 | 200 pages | True PDF EPUB | 28.23 MB
A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization​

In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems.
The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes:
Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites
Comprehensive explorations of two-dimensional transition metal dichalcogenides
Practical discussions of single layer graphene systems and nickelate systems
In-depth examinations of potential future developments and applications of spectroscopic ellipsometry
Perfect for master's- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.

Recommend Download Link Hight Speed | Please Say Thanks Keep Topic Live

Rapidgator
ozkop.rar.rar.html
NitroFlare
ozkop.rar.rar
Fikper
ozkop.rar.rar.html
Links are Interchangeable - Single Extraction
 
Top Bottom